CSS 2018 & Seed Expo

Trait-based Insect and Weed Control in Corn and Soybean Systems: History, Current Challenges, and Emerging Solutions (Room Columbus Hall C-F)

Trait-based Insect and Weed Control in Corn and Soybean Systems: History, Current Challenges, and Emerging Solutions

  1. Overview by moderator Chris Boomsma, Tri-Societies
  • The History and Future of Bt Technology
    • Description: In 20+ years what have we learned about durability of these technologies?  What’s next for the coming 20 years?
  1. Current Status of Rootworm Resistance and the Future of IPM-based Rootworm Management
  • Description: What is the latest information on trait resistance and IPM for North America, particularly concerning corn rootworm?
    • Speaker:
      • Lance Meinke, University of Nebraska-Lincoln
  1.  Bt Technology Worldwide: Use and Management of Insect Resistance
    • Description: What is the rest of the world doing regarding Bt technology and resistance, particularly China and Brazil?
    • Speaker:
      • Silvana Paula-Moraes, University of Florida