Discover what’s new and notable in XRF thickness measurement at Bowman– and win a chance at taking home $1000 cash! Raffle winner will be chosen @ Booth 510, today at 4:00!
Bowman’s P Series XRF (see a demo in booth 510 now!) guarantees 4552-A/B capability – the only XRF thickness measurement instrument to provide this critical guarantee! P Series instruments simultaneously measure up to 6 plated layers, all of which can be alloys or thin films.
Ideal for ENEPIG / ENIG, electrolytic nickel gold, electroless gold, silver and white tin; also electronic applications including Au/Si/Ni/Pd/Sn, Cu/Sn/Zn and Ni/Pd/Au.
Discover the P Series, and the entire suite of 7 Bowman plating thickness measurement systems today!
Bowman
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From:
Show Updates
03:50 PM
10 Sep 2019