Detection, Measurement and Characterization of Inclusions Using Automated SEM Techniques Part 1: The Effects of Pixel Spacing, X-Ray Collection Time and Accelerating Voltage
(Room 209C)
09 May 17
10:00 AM
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10:30 AM
Tracks:
Inclusion Analysis
The analysis of inclusions using computer-controlled scanning electron microscopes (CCSEM) has become a standard practice in many steel companies. However, automation of this type has a tendency to be viewed as a “black box,” and as such, it is not always obvious to the technician/researcher how the analysis is being performed and why. The steel industry is looking to further the use of automated SEM inclusion analysis techniques to make better, stronger and cleaner steel, and will need to harness the power of CCSEM. This paper focuses on the key analytical parameters utilized in an CCSEM inclusion analysis, including: magnification; accelerating voltage; dwell time; inclusion detection threshold settings; sizing of inclusions; x-ray analysis and scaling of the data and how they are used to developed a recipe for an analysis. The paper also reviews the trade-offs inherent in the existing technology as well as visions for the future.