Introduction to Near Ambient Pressure-X-ray Photoelectron Spectroscopy (NAP-XPS) Characterization of Various Materials
(Room Room 104-C)
02 May 19
3:40 PM
-
4:00 PM
Tracks:
Emerging Technologies
Near ambient pressure – X-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at ca. 10 mbar/10 Torr. With NAP-XPS, XPS can probe moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. This talk presents an introduction to the technique, describes significant recent advances in its instrumentation, including the development of a standalone instrument enabled by differential pumping, and shows the analysis of multiple hard-to-analyze samples by the technique. In general, the resulting spectra show features consistent with both the sample under analysis and the gas around them. The inherent ability of the technique to deal with charge compensation is discussed. Other unique features of the spectra are highlighted, including the extremely low backgrounds of gaseous samples. The considerable speed of the method and ease of sample mounting, which allow it to be used for near real time analyses, is emphasized.