Optical band pass filters (BPF) find broad range of applications in life sciences, spectroscopy, telecommunications and other areas. Deposition of BPF requires precise control of layer thicknesses. Various optical monitoring systems (OMS) were developed to enable precise layer thickness control. Historically single wavelength monitoring was used in manufacturing of band pass filters using single wavelength 'turning point' monitoring strategy. Development of broadband monitoring opened new opportunities for fabricating more complex band pass filters. State-of-the-art filter designs typically include non-quarter wave layers that allow matching a filter to a medium and allow achieving broad optical blocking range. Non-quarter wave layers can be effectively monitored by broadband optical monitoring. Broadband monitoring also has its limitations related to its finite spectral resolution. Advantages and limitations of broadband optical monitoring applied to control of bandpass filter fabrication are discussed in this work.