The Film Sense FS-1™ Multi-Wavelength Ellipsometers realize many of the benefits of spectroscopic ellipsometry without all the cost and complication. Measure thin film thickness and index of refraction from 0 – 1000 nm with exceptional precision (0.001 nm) and accuracy! The FS-1 is easy to use, robust, and affordable, making it ideal for measurements in the research lab, classroom, in situ processing environments, industrial control, and more. Please visit http://www.film-sense.com for more information.
Product Categories
Analytical/Testing
- Analytical instrumentation
- Coating characterization, physical properties
Deposition Rate Monitoring/Control
- Quartz crystal monitoring
Process Monitoring and Control
- Deposition rate monitors/controllers
Substrate Materials
- Characterization
Testing/metrology
- Thickness
Vacuum Components
- Gauges
Vacuum/Plasma Systems
- Atomic layer deposition (ALD)
- Laser ablation deposition
- Sputtering