SEMICON Korea 2019
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Test Forum
(
Room
#318, COEX
)
24 Jan 19
1:00 PM
-
4:50 PM
Tracks:
Technology
Speaker(s):
Ken Lanier, Business Unit Manager, Teradyne;
Jeonghwan Koo, Team leader/Business Promotion, Advantest;
Gregory Smith, President, Teradyne;
Ralf Touby, Sales Director Asia Pacific, Weiss Technik;
Kriss Hublitz, Technical Director, Ops, MaxLinear;
Hock W Chiang, SVP Asia Customer Group, Cohu;
Fred Pan, Principal Marketer, Semiconductor APAC, National Instruments
The 5G and Big Data, key issues in next connected world are increasing demand for putting more pressure on test costs due to higher coverage requirements. Test must become smarter to address the increased quality demands, while at the same time remaining economical. To address these challenges, test industry is struggling with increasing instrumentation integration, smarter strategies, self-test, adaptive test, system-level test, as well as more sophisticated test hardware. In this Test Forum, you can get the clues to overcome these challenges from industry expertise. Too see session agenda,
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